Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-1.1 - PM-1.4
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-4.1 - EL-4.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-2.1 - 3F-2.6
IEEE Electron Device Letters > 2016 > 37 > 11 > 1477 - 1480
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3177 - 3184
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-7-1 - EL-7-5
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4135 - 4138
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
2015 IEEE International Reliability Physics Symposium > PR.2.1 - PR.2.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 555 - 563
IEEE Electron Device Letters > 2014 > 35 > 12 > 1254 - 1256
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 11 > 2723 - 2732